Patent · US Expired

Plural-wavelength infrared detector devices

US5185648A · kind A · utility

27Cited by
5References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 10, 1991
Grant dateFeb 9, 1993
Priority date
Expiry dateSep 10, 2011

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/193

Abstract

An infrared detector device for at least two wavelengths, i.e. 3 to 5 microns and 8 to 14 microns, comprises detector elements (10 and 20) formed in two or more infrared-sensitive materials with different badgaps, e.g. in cadmium mercury telluride. These materials may be provided side-by-side in a single level on a substrate (3) or preferably as different levels (1 and 2) on the substrate (3). Each detector element (10 and 20) comprises a p-n junction (11 and 21) between opposite conductivity type regions (12,13 and 22,23). Electrical connections (15,25,24) extend from these regions to the substrate (3). Freedom in design and fabrication is obtained by a connection structure in which one connection (25) of the longer-wavelength response element (20) contacts both the semiconductor material (2) of that element (20) and the larger-bandgap material (1) of the shorter-wavelength response element (10), at a side-wall (42) of both materials. The larger-bandgap material (1) comprises a further region (18) which adjoins the side-wall (42) and which forms a further p-n junction (19) electrically in parallel with the p-n junction (21) of the longer-wavelength detector element (20).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.