Method for controlling the thickness of a layer of material in a seam
US5188426A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 11, 1991 |
| Grant date | Feb 23, 1993 |
| Priority date | — |
| Expiry date | Sep 11, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/101
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining the thickness of a layer of material, such as soil, wood, ice or coal, that utilizes a microstrip antenna as a thickness measuring sensor. The sensor is positioned over the layer and a value for a parameter of the antenna such as conductance or resonant frequency is measured. The value is compared to a calibration table of values and the thickness of the layer is determined by interpolation. Alternatively, the value is compared to a control value to initiate a decision process. The decision could be that a layer of ice is building up on a wing of an aircraft or that an explosive device is buried under a layer of soil.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.