Measuring noise figure and y-factor
US5191294A · kind A · utility
25Cited by
3References
28Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 21, 1992 |
| Grant date | Mar 2, 1993 |
| Priority date | — |
| Expiry date | Jul 21, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for measuring the noise parameters of a device under test (DUT), with full compensation for impedance mismatches between the DUT and the test apparatus. The apparatus includes an S-parameter measuring device, such as vector network analyzer (VNA), combined with a noise module. The noise module includes, among other things, a pair of test ports for the DUT, a noise source which can be turned on or off by an external controller, a receiver, and a switch for coupling the output of the DUT to selectably either the receiver or port 2 of the VNA.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.