X-ray examination apparatus including a matrix of sensors and device measuring exposure of groups of sensors during execution of an X-ray exposure
US5194736A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 1991 |
| Grant date | Mar 16, 1993 |
| Priority date | — |
| Expiry date | Nov 7, 2011 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/44
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An X-ray examination apparatus includes a sensor matrix (41) with sensors (1) which are arranged in rows and columns and each of which comprises an X-ray sensitive photosensor element (11) and a storage capacitance (12) which is connected parallel thereto. First electrodes of the sensors are connected to a counter-electrode (2) which receives a direct voltage, second electrodes being connected to an electric switch (13) provided for each sensor. For exposure measurement the currents flowing through the counter-electrode (electrodes) (2) and/or the electric switches (13) after the brief closing of the electric switches (13) and before the reading of the charges are used to measure and/or correct the exposure of groups of the sensors during the execution of an X-ray exposure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.