Patent · US Expired

Method of fabricating silicon-based carriers

US5196377A · kind A · utility

32Cited by
20References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 20, 1991
Grant dateMar 23, 1993
Priority date
Expiry dateAug 20, 2011

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Silicon is used to create multi-chip carriers for integrated circuits. The process of fabricating the carriers uses standard integrated circuit fabrication equipment. Cavities are etched into a silicon wafer, metallization or polysilicon is deposited to electrically interconnect the cavities, and integrated circuit die are placed in the cavities. Traces connecting the integrated circuits are buried in channels formed in the silicon, which can be doped and biased to provide enhanced isolation between traces as well as control over the electrical characteristics of the traces. The traces can be formed in multiple layers of material placed on the wafer to provide additional communication capacity in the carriers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.