Apparatus and method for non-contact measurement of the edge sharpness of a knife
US5196800A · kind A · utility
3Cited by
6References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 13, 1991 |
| Grant date | Mar 23, 1993 |
| Priority date | — |
| Expiry date | Sep 13, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Non-contact measurement of the sharpness of the cutting edge of a slitting or chopping knife is made repeatably placing a capacitance sensor probe symmetrically over the cutting edge at a predetermined distance (nominal offset) from the calibrated sharp edge of the knife and measuring the capacitance to derive a measurement that varies with knife wear (increasing knife edge radius). A novel sensor holder allowing for repeatable precision placement of the sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.