Patent · US Expired

Two-beam interferometer apparatus and method, and spectrometer utilizing the same

US5196902A · kind A · utility

22Cited by
5References
25Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 9, 1991
Grant dateMar 23, 1993
Priority date
Expiry dateOct 9, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J3/453
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A two-beam interferometer for Fourier spectroscopy comprises one or two reflecting channels, each having at least one relatively movable wall to vary the path length of a beam traversing the same. A beam passing through the channel makes multiple reflections therewithin, impinges upon a retroreflector, and is transferred back through the channel along the same path to recombine with a second beam, which can be similarly reflected. The multiple reflections that occur within the channel allow a large total path length change to be accomplished with a small degree of motion of the movable wall, to thereby achieve high levels of resolution.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.