Extended laser life
US5199037A · kind A · utility
1Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 24, 1991 |
| Grant date | Mar 30, 1993 |
| Priority date | — |
| Expiry date | Sep 24, 2011 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S3/134
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Extended laser life may be obtained by measuring, with an ammeter AM, the discharge current applied to a laser (either linear or a ring laser gyro RLG), measuring the intensity of the resulting light beam with an intensity monitor IM, calculating the noise with an integrated circuit IC, and maintaining the discharge current at the lowest level possible which is consistent both with maintaining the intensity above the intensity service limit and the noise below the noise service limit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.