Source distance adjustment arrangement for uniform illumination of projection surface
US5200603A · kind A · utility
4Cited by
2References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 22, 1992 |
| Grant date | Apr 6, 1993 |
| Priority date | — |
| Expiry date | Apr 22, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03B27/74
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A uniform illumination of the projection surface is obtained by measuring light intensity of a projection surface and adjusting a distance between a light source and an optical element in response to the measured light intensity to optimize brightness and/or distribution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.