Patent · US Expired

Device and method for analyzing ions of high mass

US5202561A · kind A · utility

58Cited by

10References

4Claims

0Family size

Assignee

Finnigan Corporation · US

Inventors

Ulrich Giessmann · Bremen, DE
Franz Hillenkamp · Münster, DE
Michael Karas · Hattersheim, DE

Key dates

Filing date	May 31, 1991
Grant date	Apr 13, 1993
Priority date	—
Expiry date	May 31, 2011

Classification

Technology area (CPC G)Physics
CPC primaryG01T1/28
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

Detector device for analyzing ions of high mass using a time-of-flight (TOF) analytical method, consisting of a mass spectrometer 1, accelerating electrodes 2 and a magnetic field and/or electric field, all of which serves to deflect secondary ions 5 emerging from a first conversion dynode 8, so that the secondary ions impinge according to polarity on a second 7 and third 7' conversion dynode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.