On-chip self-test circuit
US5202626A · kind A · utility
9Cited by
6References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 25, 1991 |
| Grant date | Apr 13, 1993 |
| Priority date | — |
| Expiry date | Oct 25, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An on-chip self-test circuit has been provided that allows for accurately testing a device such as prescaler at high frequencies. The on-chip self-test circuit includes a voltage controlled oscillator for providing high frequency signals to the device under test. The on-chip self-test circuit is rendered active only when one desires to test the device. Thus, when not testing, the on-chip self-test circuit is transparent to the device and consumes substantially zero power.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.