Method of non-destructive lamp testing by sensing light output
US5202636A · kind A · utility
5Cited by
2References
1Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 22, 1991 |
| Grant date | Apr 13, 1993 |
| Priority date | — |
| Expiry date | Feb 22, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/44
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for testing electrical lamps includes a hollow cylinder. Lamps are placed in the hollow cylinder and the light emitted from the lamp is focused onto a phototransistor by a focusing lens. The output of the phototransistor is measured against the electrical voltage input into the lamp. If the output of the phototransistor lags behind the input voltage to the lamp by more than a predetermined amount, the lamp is rejected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.