Tandem mass spectrometry systems based on time-of-flight analyzer
US5206508A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 18, 1991 |
| Grant date | Apr 27, 1993 |
| Priority date | — |
| Expiry date | Oct 18, 2011 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/40
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A tandem mass spectrometry system, capable of obtaining tandem mass spectra for each parent ion without separation of parent ions of differing mass from each other, comprising an ion source, (1) a particle detector (6), two separated time-of-flight devices (3, 5) between the source and the detector, a control ion-excitation device (4) between the time-of-flight devices, and means measuring a time-of-flight for particles reaching the detector (6), all of which lie on a common ion path, and wherein ion optics maintain ion flight from the source within the ion path and a computer control system controls the excitation device (4) and the optics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.