Method and system for the calibration of an x-ray scanner using an off-centered circular phantom
US5214578A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 7, 1989 |
| Grant date | May 25, 1993 |
| Priority date | — |
| Expiry date | Jun 7, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T11/005
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method and system to calibrate an X-ray scanner uses a single circular phantom. The circular phantom is off-centered with respect to the axis of rotation of the scanner so as to introduce different paths in the phantom for each channel, depending on the angular positions of the scanner. This results in different attenuation measurements which are compared with values obtained by the computation of the path lengths which depend on the off-centered coordinates r and .PHI. and on the position of the scanner, thus enabling computation of the polynomial approximation coefficients to be applied to the measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.