Patent · US Expired

Semiconductor integrated circuit

US5214609A · kind A · utility

26Cited by
1References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 1991
Grant dateMay 25, 1993
Priority date
Expiry dateAug 29, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C8/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In the semiconductor integrated circuit, the data delay circuit and data latch circuit are connected between the sense amplifier circuit and the output buffer circuit. A pulse signal for controlling the output buffer is first generated according to a pulse output signal of the address change detection circuit, and then a latch signal which permits output data of the data detection circuit obtained before the change of the address input signal to be latched by the data latch circuit for a preset period of time is generated. Next, a delay signal is generated which sets the delay time of the data delay circuit to be short in a case where data detected by the data detection circuit is not output from the output buffer circuit, and sets the delay time of the data delay circuit to be long in a case where data is output from the output buffer circuit. Generation of the delay signal is interrupted after the pulse signal of the address change detection circuit is interrupted. As a result, the power source variation at the time of output data change or erroneous operation due to noise input from the exterior can be prevented. Further, the driving ability of the output buffer transistor can b…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.