Circuit element measuring apparatus and method for measuring a parameter of a DUT including a compensation network having an admittance characteristic
US5216373A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 28, 1992 |
| Grant date | Jun 1, 1993 |
| Priority date | — |
| Expiry date | Sep 28, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A circuit element measuring apparatus for measuring a parameter of a device under test (DUT) includes a signal source, a voltmeter, a zero detection amplifier, and a compensation network all of which are coupled to the DUT by four shielded lines. The compensation network is also coupled to a range resistance. The compensation network provides two independent sets of correction data. One is based on the length of the shielded line and the other is based on the range resistance used. The parameter being measured can then be adjusted by the appropriate set of correction data to provide a more accurate measurement. A method of operating the circuit element measuring apparatus for measuring the parameter of the DUT by generating the two sets of correction data and adjusting the parameter accordingly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.