Patent · US Expired

Method of making an adaptive configurable gate array

US5217916A · kind A · utility

301Cited by
4References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 4, 1991
Grant dateJun 8, 1993
Priority date
Expiry dateFeb 4, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/975

Abstract

A new configurable gate array is defined in a master slice wafer form without borders of the kind currently known between constituent transistor gates, effectively providing a sea of gates over the wafer, interrupted if at all by islands, containing markers or the like; and a resultant application specific integrated circuit formed of such master slice is defined. In the IC, transistor gate cells, which are the same type of cells used for other purposes in the IC, are configured to serve the input and output function. Accordingly, the input and output function may be placed on any location in the IC. As an incident to personalization of the wafer saw lanes are formed of channels that extend over transistor cells and the latter cells are consequently destroyed in slicing the wafer. Means are also disclosed for an improved E-beam lithographic apparatus which permits an IC chip to be placed on an area of a wafer that is occupied by a marker, providing a wiring or macro design that avoids the marker.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.