Method and apparatus for determining at least one characteristic of a superconductive film
US5218296A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 1992 |
| Grant date | Jun 8, 1993 |
| Priority date | — |
| Expiry date | Feb 7, 2012 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S505/726
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are apparatus and method for measuring a characteristic of a film comprised of a material that is a superconductor below a critical temperature. The apparatus includes a magnetic circuit for inducing an alternating magnetic flux at a localized region of a surface of the film. The circuit includes a magnetic core (42) having a gap (44) made therein and a drive winding (46) coupled thereto. A current source (50) is coupled to the drive winding for passing an alternating current therethrough for inducing an alternating magnetic flux within the gap. Measurement circuitry (54, 56) is responsive to a current induced within the film by an entry of the magnetic flux into the film. A processor (60) is coupled to the measurement circuitry and determines a critical current density of the superconducting film within the localized region. The measurement circuitry includes a sense winding (48) that is coupled to the core and detects a magnitude of an electrical signal induced in the sense winding by the alternating magnetic flux.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.