Test system with reduced test contact interface resistance

US5221905A · kind A · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Labh S. Bhangu · Hopewell Junction, US
• Thomas Morrison · Pleasant Valley, US
• Klaus Probst · Herrenberg, DE

Key dates

• Filing date: Feb 28, 1992
• Grant date: Jun 22, 1993
• Expiry date: Feb 28, 2012

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/67
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An improved test system includes means for generating a contact wetting pulse and applying the contact wetting pulse to a network such that contact resistance at the interfaces between probes of the test system and terminals of the network is effectively lowered.