Tuning the scanning electron beam computed tomography scanner
US5224137A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 23, 1991 |
| Grant date | Jun 29, 1993 |
| Priority date | — |
| Expiry date | May 23, 2011 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/30
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A scanning electron beam computed tomography scanner is disclosed herein and includes means defining a vacuum chamber, means for producing an electron beam at one location in the chamber and for directing it to a second location therein, a target located at a third position therein of the type which produces X-rays as a result of the impingement thereon by the electron beam, means for focusing the beam onto the target in the form of a beam spot and for scanning the beam spot across the target along a particular scan path in order to produce X-rays, and means for monitoring the profile, position, and orientation of the beam spot at a plurality of locations along the scan path. The specific scanner disclosed also includes an arrangement for determining from the signals produced by the monitoring devices if the beam spot conforms to as desired profile, position, and orientation and automatically adjusting the electron beam such that its profile, position, and orientation conform to desired values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.