Patent · US Expired

Semiconductor wafer and manufacturing method therefor

US5225235A · kind A · utility

8Cited by
13References
23Claims
0Family size

Assignees

Inventors

Key dates

Filing dateAug 5, 1991
Grant dateJul 6, 1993
Priority date
Expiry dateAug 5, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24975
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor wafer on which silicon or the like is epitaxially grown and p-type or n-type impurities are doped and which has at the rear surface except for the peripheral edge portion thereof a blocking film for preventing jumping out of impurities therefrom which causes auto-doping, thereby preventing silicon particles from being produced at the peripheral surface and preventing the semiconductor wafer from being contaminated by the silicon particles during the manufacturing a semiconductor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.