Method for correcting measuring values when measuring liquid scintillation samples deposited on sample plates
US5225680A · kind A · utility
7Cited by
4References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 9, 1991 |
| Grant date | Jul 6, 1993 |
| Priority date | — |
| Expiry date | Sep 9, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/204
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A method for correcting measuring values when measuring liquid scintillation samples deposited on sample plates by a photodetector which will be affected by scintillation photons from other samples in the plate in addition to the sample being measured. Said correction is done by pre-determining affection of the other samples of the plate as a function of quench level and correcting observed measuring values using this function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.