Process for the elementary analysis of a specimen by high frequency inductively coupled plasma mass spectrometry and apparatus for carrying out this process
US5229605A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Jan 2, 1992 |
| Grant date | Jul 20, 1993 |
| Priority date | — |
| Expiry date | Jan 2, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N30/7206
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Improvement to the process of elementary analysis of a specimen by high frequency inductively coupled plasma mass spectrometry, by means of an apparatus including a torch for producing plasma from a plasma producing medium and for injecting the specimen in this plasma and an interface for taking a sample in the specimen, comprising two consecutive conical members disposed along the same axis except that the conical members have angles with different apices and are each provided with an axial orifice enabling a fraction of the specimen to be analyzed to pass therethrough. According to the invention, a given quantity of a make-up gas is added to the specimen which is injected into the plasma, the make-up gas having a high heat producing power, so as to raise the temperature of the plasma for locally heating the sampling conical members thereby preventing the components of the specimen which are present in the plasma from depositing on the conical members. Preferably, the sampling conical members (18,19) are made of an alloy of niobium, hafnium, titanium.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.