Sensor and method for measurment of select components of a material based on detection of radiation after interaction with the material
US5235192A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 9, 1991 |
| Grant date | Aug 10, 1993 |
| Priority date | — |
| Expiry date | Dec 9, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8663
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sensor and method is provided for measuring one or more select components of a material. In one embodiment, a method measures the components by emitting electromagnetic radiation at the material and detecting the intensity of the emerging radiation at separate locations from the source. In another embodiment, a sensor provides a radiation source for emitting radiation at a sheet, a plurality of detecting means, wherein at least one detecting means is offset from the source, for detecting radiation after interaction with the sheet and first and second reflectors for directing the radiation so that the radiation makes multiple interactions with the sheet when moving from the source to the detecting means. The invention can accurately measure the select components (e.g., moisture) of different grades of paper by eliminating the effects of the scattering power and determining absorption power at each band of the spectrum considered necessary for a particular measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.