System and method for testing manufactured lots of electronic devices
US5235271A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 7, 1990 |
| Grant date | Aug 10, 1993 |
| Priority date | — |
| Expiry date | Sep 7, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31903
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for testing semiconductor IC chips including a first tester, a second tester, a test program control section, and a distribution control section. The test program control section supplies data representing a plurality of test items, to the first tester. The first tester determines the characteristics of the semiconductor IC chips of each lot, for each test item. The data representing the characteristics of the IC chips, thus determined for each test item, is supplied to the distribution control section. The distribution control section finds the distribution of the characteristics of the IC chips, and determines whether the distribution is within a predetermined range. If the characteristic distribution is within the range, the distribution control section supplies data representative of the number assigned to the test item to the test program control section, and the test program control section, then deletes the test item corresponding from data supplied to the second tester. The data representing the remaining test items is supplied from the test program control section to the second tester. The second tester tests the IC chips for only the undeleted test items.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.