Apparatus and method for determining high temperature surface emissivity through reflectance and radiance measurements
US5239488A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 23, 1990 |
| Grant date | Aug 24, 1993 |
| Priority date | — |
| Expiry date | Apr 23, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/453
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The apparatus and method permit simultaneous and precise determination of the temperature and spectral emittance, over a wide spectral region, of a hot sample. Radiance, and hemispherical reflectance and transmittance measurements are employed, and FT-IR technology is advantageously applied. Reflectance and (where necessary) transmittance measurements are utilized to determine the fraction of incident radiation, of selected wavelength, that is absorbed by the sample, in turn establishing a spectral emittance value. Taken with the measured radiance at the same wavelength, the spectral emittance value will provide a quantity that can be matched with the spectral radiance of a theoretical black body, again at the selected wavelength, to thereby derive the temperature of the hot sample; this in turn enables determination of the spectral emittance of the sample over a desired spectral range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.