Patent · US Expired

Processes for lift-off of thin film materials and for the fabrication of three dimensional integrated circuits

US5244818A · kind A · utility

117Cited by
9References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 8, 1992
Grant dateSep 14, 1993
Priority date
Expiry dateApr 8, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/135
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Various novel processes permit integrating thin film semiconductor materials and devices using lift off, alignment, and deposition onto a host substrate. As a result, three dimensional integrated circuits can be constructed. Three dimensional communication in an integrated circuit can be implemented via electromagnetic communication between emitters and detectors fabricated via the novel processes. Integrated circuit layers are transparent to the electromagnetic signals propagated from the emitter and received by the detector. Furthermore, arrays of optical detectors can be implemented to perform image processing with tremendous speed. Processing circuitry can be situated directly below the optical detectors to process in massive parallel signals from individual optical detectors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.