Patent · US Expired

Method of manufacturing fusible links in semiconductor devices

US5244836A · kind A · utility

91Cited by
5References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 30, 1991
Grant dateSep 14, 1993
Priority date
Expiry dateDec 30, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/131
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention provides a method of forming fuse ribbons between conductive layers on a semiconductor device. The formation of these fuse ribbons may be at different levels of multiple level integrated circuits. The fuse ribbons are formed in a more precise manner than can be obtained conventionally. Resistance control can be easily achieved and significant decreases in dimensions and the use of less fuse material can be achieved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.