Patent · US Expired

Method and apparatus for spatially resolved modulated differential analysis

US5248199A · kind A · utility

22Cited by
13References
72Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 26, 1992
Grant dateSep 28, 1993
Priority date
Expiry dateMay 26, 2012

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB82Y35/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention is a spatially-resolved differential analysis technique. A modulated differential analysis technique is applied using a proximal probe to obtain a spatially resolved characterization of a heterogeneous sample comprising at least two phases. As applied to spatially-resolved modulated differential scanning calorimetry, the present invention comprises a thermocouple probe that is scanned over the sample surface. The differential temperature of the area of the sample just beneath the thermocouple probe is obtained with respect to the temperature of a reference. The temperature of the sample and the reference is modulated above and below a transition temperature for one phase of the sample. The signal from the thermocouple probe is deconvoluted to obtain an image of the sample delineating the regions of the sample having that phase.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.