Patent · US Expired

Method of producing semiconductor substrate

US5250460A · kind A · utility

305Cited by
2References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 9, 1992
Grant dateOct 5, 1993
Priority date
Expiry dateOct 9, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/15
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of producing a semiconductor substrate, comprises the steps of: forming pores in the entire body of a single-crystal silicon substrate by anodization; epitaxially growing a single-crystal silicon layer on a surface of the porous single-crystal silicon substrate; sticking a supporting substrate to the surface of the epitaxial layer of single-crystal silicon by using an adhesive; selectively etching the porous single-crystal silicon substrate; sticking the epitaxial layer fast to a transparent insulating substrate containing SiO.sub.2 as a main constituent; separating the supporting layer from the epitaxial layer by removing the adhesive; and heat-treating the epitaxial layer stuck fast on the transparent insulating layer. Alternatively, a porous layer is formed in a surface portion of a single-crystal silicon substrate, and then, the non-porous portion is removed before the porous layer is selectively etched.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.