Patent · US Expired

Manually-operated continuity/shorts test probe for bare interconnection packages

US5256975A · kind A · utility

20Cited by
8References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 1, 1992
Grant dateOct 26, 1993
Priority date
Expiry dateJun 1, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/312
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A hand-held test probe is employed which uses a capacitance measuring circuit to measure capacitance as the probe is scanned along a pattern of conductors (pads or pins) at a steady rate. The capacitance measurement is stored in a memory during the scan, then maximums are detected in the stored data, corresponding to the conductor pattern. If a particular conductor has a short or a break in continuity, its capacitance will be more or less than it should be. The detected maximums are compared with recorded values for a known-good printed wiring board for this scan pattern. If the comparison shows a difference greater than a selected threshold, an error is indicated for this pin location. The known-good is scanned in a "learn" mode, in which the capacitance values are stored for each scan, identified by scan number.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.