Laminography system and method with electromagnetically directed multipath radiation source
US5259012A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 30, 1990 |
| Grant date | Nov 2, 1993 |
| Priority date | — |
| Expiry date | Aug 30, 2010 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/30
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A tomographic inspection system which enables multiple locations within an object to be imaged without mechanical movement of the object. The object is interposed between a rotating X-ray source and a synchronized rotating detector. A focal plane within the object is imaged onto the detector so that a cross-sectional image of the object is produced. The X-ray source is produced by deflecting an electron beam onto a target anode. The target anode emits X-ray radiation where the electrons are incident upon the target. The electron beam is produced by an electron gun which includes X and Y deflection coils for deflecting the electron beam in the X and Y directions. Deflection voltage signals are applied to the X and Y deflection coils and cause the X-ray source to rotate in a circular trace path. An additional DC voltage applied to the X or Y deflection coil will cause the circular path traced by the X-ray source to shift in the X or Y direction by a distance proportional to the magnitude of the DC voltage. This causes a different field of view, which is displaced in the X or Y direction from the previously imaged region, to be imaged. Changes in the radius of the X-ray source path re…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.