High-resolution light microscope using coherent light reflected from a target to modulate the power output from a laser
US5260562A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 24, 1991 |
| Grant date | Nov 9, 1993 |
| Priority date | — |
| Expiry date | Mar 24, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical microscope for examining surface features of a target surface, at a resolution, in one dimension, in the picometer-to-nanometer range. The microscope includes a laser for use in producing a coherent output light beam, a lens for focusing the output beam onto a target, and a photodetector for measuring the power output of the beam. The focused beam is moved relative to the target surface in a defined position-dependent pattern, with a portion of the light reflected from the target surface being reflected back into the laser. Changes in the measured power of the laser are converted to position-dependent surface displacements, in the direction of the output beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.