Patent · US Expired

High-resolution light microscope using coherent light reflected from a target to modulate the power output from a laser

US5260562A · kind A · utility

15Cited by
10References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 24, 1991
Grant dateNov 9, 1993
Priority date
Expiry dateMar 24, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/303
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An optical microscope for examining surface features of a target surface, at a resolution, in one dimension, in the picometer-to-nanometer range. The microscope includes a laser for use in producing a coherent output light beam, a lens for focusing the output beam onto a target, and a photodetector for measuring the power output of the beam. The focused beam is moved relative to the target surface in a defined position-dependent pattern, with a portion of the light reflected from the target surface being reflected back into the laser. Changes in the measured power of the laser are converted to position-dependent surface displacements, in the direction of the output beam.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.