Self-testing and self-configuration in an integrated circuit
US5260946A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 3, 1991 |
| Grant date | Nov 9, 1993 |
| Priority date | — |
| Expiry date | Jun 3, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/27
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Integration at the chip level is supported by an architecture for self-testing and self-configuration of an integrated circuit. Self-testing requires the generation of test signals based on primary root polynomials, application of the test signals to functionally redundant modules, and evaluation of the response of the modules to the test signals. The response produced by a module is compared against the response predicted from error-free operation of the module. Modules whose responses correspond to the expected responses are interconnected for circuit operation. All of the architecture for self-testing and self-configuration is integrated with the tested and configured modules.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.