Patent · US Expired

Method of making a semiconductor memory device having error checking/correcting functions

US5262342A · kind A · utility

12Cited by
15References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 7, 1991
Grant dateNov 16, 1993
Priority date
Expiry dateOct 7, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/1076
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor memory device having error checking/correcting functions includes a circuit (10) for generating a code for error checking/correcting based on information externally supplied and linking the information and the code to be transmitted to a memory cell array (1), and another circuit (11) for error checking and correcting read-out information from the information and the code which are read-out from the memory cell array so as to output correct read-out information. The code word generating circuit (10) and the error checking/correcting circuit (11) are formed of a masked ROM integrated on the same semiconductor chip (100) as that of the memory cell array (1) in the memory device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.