Computer system operation with corrected read data function
US5263032A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 27, 1991 |
| Grant date | Nov 16, 1993 |
| Priority date | — |
| Expiry date | Jun 27, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/1024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer system having a memory with an ECC function employs an improved method for handling corrected read data events, so transient errors caused by alpha particle hits in DRAMs may be distinguished from hard errors. When a corrected read data event occurs, a footprint defining its location is compared with previously-stored footprints to determine if this location has failed before. Also, a location showing a corrected read data event is "scrubbed" (data is read, corrected and rewritten) so transient error locations are removed. If another corrected read data event occurs for this same location, after scrubbing, then the location is assumed to have a hard fault, and so the page containing this location is replaced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.