Patent · US Expired

Function array sequencing for VLSI test system

US5265101A · kind A · utility

2Cited by
6References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 12, 1989
Grant dateNov 23, 1993
Priority date
Expiry dateApr 12, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31908
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A function array system includes a controller, a test function and specific memories to accelerate the execution of a VLSI device test program by preloading register files associate with each hardware function in the tester with test set-up information. Test information is transferred to the register files only once when the test program is initially downloaded into the tester. A simple controller sequences a test set-up pointer during test execution.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.