Patent · US Expired

Temperature compensated optical detector

US5266792A · kind A · utility

33Cited by
14References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 28, 1991
Grant dateNov 30, 1993
Priority date
Expiry dateOct 28, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2001/444
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An optical wavelength detector includes a photoelectric device that produces a signal in response to incident light thereon corresponding to a characteristic of the incident light such as wavelength. A light source is provided that can selectively expose light to the photoelectric device. A memory device stores device characterization data that corresponds wavelength information to current ratio signals from the photoelectric device. The current ratio signals are digitized and form part of the address for the memory. In a temperature compensated embodiment, the optical wavelength detector includes means to determine a temperature dependent electrical characteristic of the photoelectric device. In the preferred embodiment this electrical characteristic is the forward bias voltage detected when a predetermined forward bias current is applied to the photoelectric device in the dark. The temperature dependent forward bias voltage is converted to a digital signal and provides another part of the digital address for the memory. The memory generates a temperature compensated signal that corresponds to the incident light wavelength.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.