Magnetic field observation with tunneling microscopy
US5266897A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 24, 1993 |
| Grant date | Nov 30, 1993 |
| Priority date | — |
| Expiry date | Feb 24, 2013 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/901
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Tunneling microscopy can be used to observe simultaneously the topography of a sample surface that is conductive and data related to the magnetic field near the surface. A tunneling microscope apparatus has a cantilever supporting a tip which has a magnetic moment. To use the apparatus according to a first preferred method, a magnetic field alternating at a predetermined frequency is produced by the sample near the sample surface to vibrate the tip by a magnetic interaction with the magnetic moment. To use the apparatus according to a second preferred method, the direction of the magnetic moment of the tip is switched at a predetermined frequency to vibrate the tip by creating an interaction between the magnetic moment and a magnetic field of the sample. For both preferred methods, the tip is maintained at a distance from the sample surface so as to permit a tunneling current to flow. A component of the predetermined frequency of the tunneling current is extracted to obtain a signal for observing the magnetic field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.