Patent · US Expired

Boron nutride membrane in wafer structure

US5270125A · kind A · utility

239Cited by
1References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 25, 1991
Grant dateDec 14, 1993
Priority date
Expiry dateOct 25, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24777
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A laminated structure includes a wafer member with a membrane attached thereto, the membrane being formed of substantially hydrogen-free boron nitride having a nominal composition B.sub.3 N. The structure may be a component in a mechanical device for effecting a mechanical function, or the membrane may form a masking layer on the wafer. The structure includes a body formed of at least two wafer members laminated together with a cavity formed therebetween, with the boron nitride membrane extending into the cavity so as to provide the structural component such as a support for a heating element or a membrane in a gas valve. In another aspect borom is selectively diffused from the boron nitride into a <100> surface of a silicon wafer. The surface is then exposed to EDP etchant to which the diffusion layer is resistant, thereby forming a channel the wafer member with smooth walls for fluid flow.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.