Molecular imaging system
US5272338A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 21, 1992 |
| Grant date | Dec 21, 1993 |
| Priority date | — |
| Expiry date | May 21, 2012 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2533
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ion-beam based system enables quantitative analysis and visualization of a sample with atomic and molecular specificity. The system comprises a liquid metal ion source that directs a tightly focused beam of ions at the sample, the beam having an ion density that is insufficient to materially change the surface properties of the sample. A controller connected to the liquid metal ion source gates on the ion beam for a period of time that is sufficient to enable the ion source to achieve a tight focus of the beam at the sample and for further scanning the ion beam across the sample. A laser beam is positioned over the sample and has a wavelength that resonantly ionizes components of the sample that are liberated by action of the scanned ion beam. A detector measures the liberated ionized components and is connected to a display system that provides an image of the distribution of the species on surface of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.