Chatter and profile measuring using capacitor sensors
US5272443A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 22, 1992 |
| Grant date | Dec 21, 1993 |
| Priority date | — |
| Expiry date | Apr 22, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/087
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring chatter marks on a metal workpiece. The method includes first removing gross buckle or curvature in the workpiece by clamping the same in the device having an elongated jaws and in a manner that locates a portion of the workpiece outside of the jaws so that an elongated portion of the workpiece is available for inspection by capacitive sensors. The sensors are located adjacent at least one surface of the elongated portion of the workpiece, the sensor and workpiece forming an electrical capacitor when appropriate potentials are applied to the sensor and workpiece. The sensors are now moved along the surface in the elongated direction of the workpiece to detect chatter marks on the surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.