Patent · US Expired

Semiconductor integrated circuit device

US5272676A · kind A · utility

22Cited by
2References
10Claims
0Family size

Assignees

Inventors

Key dates

Filing dateNov 6, 1991
Grant dateDec 21, 1993
Priority date
Expiry dateNov 6, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/40615
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The self-refresh operation of one round of a RAM using dynamic memory cells is accomplished on the basis of the periodic pulses which are formed by an oscillating circuit substantially having no temperature dependency, and the self-refresh period is controlled by a timer circuit using a time constant circuit corresponding to the temperature dependency of the data storage in the memory cells. The operating voltage or boosted output voltage is monitored to switch the circuit operation for generating a plurality kinds of boosted voltages rising sequentially two and three times so that the boosted voltage may be a desired voltage. A control voltage to be fed to the gate of a MOSFET connected between the substrate and the earth potential of the circuit is generated by a dummy substrate voltage generator having a leakage current path varying to follow the fluctuations in a supply voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.