Method for forming semiconductor thin films where an argon laser is used to suppress crystal growth
US5273932A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 25, 1992 |
| Grant date | Dec 28, 1993 |
| Priority date | — |
| Expiry date | Aug 25, 2012 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S148/048
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The growth rate of a compound semiconductor thin film is freely enhanced or suppressed by establishing a proper temperature of a substrate 10, and by irradiating by an MOMBE technique, portions corresponding to a desired pattern on the substrate 10 with laser rays having an energy lower than that of photon which can directly decompose an organometal during film growth. A compound semiconductor thin film having a fine pattern with complicated unevenness can be formed on the substrate 10. The relative positions of the source 11 of laser rays, the optical systems 12 and 31 for irradiating the substrate with the laser rays, and the substrate 10 in the vacuum chamber 1 are maintained constant by mounting the body 1 of the MOMBE system, the source 11 of the laser rays, and the optical systems 12 and 31 for guiding the laser rays to the body 1 of the MOMBE system on a vibration proof base 30, whereby the formation of a fine pattern becomes possible.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.