Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide by RNF method
US5278628A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 7, 1992 |
| Grant date | Jan 11, 1994 |
| Priority date | — |
| Expiry date | Apr 7, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/412
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to the present invention, there are provided a projection system having an optical axis inclined toward one end surface of an optical waveguide portion arranged on one side of a substrate portion and for irradiating luminous flux for measurement from one end surface of the optical waveguide portion, and a light receiving unit for receiving luminous flux leaking from the optical waveguide portion among the luminous fluxes for measurement, projected light is effectively utilized for measurement, whereby cross-sectional distribution of refractive index of the optical waveguide is measured by change of light quantity entering said light receiving unit in case an incident point of the luminous flux is moved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.