Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide by RNF method
US5280334A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 7, 1992 |
| Grant date | Jan 18, 1994 |
| Priority date | — |
| Expiry date | Apr 7, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/412
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to the present invention, there are provided a projection system for emitting luminous flux for measurement, a light receiving unit or a prism member furnished with a light receiving unit, and an optical waveguide substrate comprising a substrate portion and an optical waveguide portion formed on the substrate portion, the light receiving unit or the prism is brought into close contact with the optical waveguide substrate, luminous flux for measurement from the projection system is passed from one end of the optical wavegide portion and a part of the luminous flux for measurement is leaked toward the light receiving unit, whereby cross-sectional distribution of refractive index of the optical waveguide is measured by change of light quantity of the leaking light sensed at the light receiving unit in case an incident point of the luminous flux for measurement is moved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.