Reflectance probe
US5282017A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 5, 1990 |
| Grant date | Jan 25, 1994 |
| Priority date | — |
| Expiry date | Jan 5, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2005/0074
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for measuring the value of the directional spectral hemispherical reflectance of the surface of a target when not engaging but being spaced from the target employs a hollow elongated member having a longitudinal axis and first and second opposite ends. The area of the first end is relatively large relative to that of the second end. The first end is open. The member has an inner chamber extending between the ends and has an inner surface adapted to reflect light falling within a specified wave band. The member when the apparatus is in use is positioned with the first end adjacent but spaced from a selected portion of the surface of the target. The longitudinal axis is oriented essentially normal to a region on the selected surface which would be engaged by a line coincident with the axis and sufficiently extended outwardly from the first end. A beam of light falling within said band is directed within at least a portion of the chamber along the axis and outward through the first end to impinge upon the selected surface portion. A portion of the beam is reflected after said impingement backward through the first end into the chamber. The reflected light which strikes the i…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.