Integrated-optics expansion interferometer in an extension-metrological neutral environment
US5289256A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 26, 1993 |
| Grant date | Feb 22, 1994 |
| Priority date | — |
| Expiry date | Jan 26, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/29355
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated-optics extension interferometer, in which the measuring and reference arm, the beam splitter and the beam coupler as well as entrances and exits for primary light and interference light are integrated in the baseplate, can be applied in the manner of a wire strain gauge to components to be investigated. The portions of the waveguide which form the measuring and reference arm are integrated over their entire length in the baseplate, and are disposed in a plurality of loops with mutually parallel oriented straight active partial sections and intermediate deflecting sections, in which a coupling free mutual minimum spacing of all straight active partial sections and deflecting sections of the integrated waveguides forming the measuring and reference arm respectively is observed at all locations. As a result of this, the fundamental interferometer can be applied to the surface of stressed workpieces in a manner which is as simple and space-saving as a conventional electrical-resistance wire strain gauge for extension measurements. In order to achieve an automatic compensation of the extension due to temperature, the reference arm is also expediently wound in the manner of…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.