Patent · US Expired

Epoxy resin composition for semiconductor encapsulation and semiconductor device using the same

US5294835A · kind A · utility

10Cited by
2References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 28, 1992
Grant dateMar 15, 1994
Priority date
Expiry dateJul 28, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2224/48465
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device in which a semiconductor chip is encapsulated in an epoxy resin composition comprising (A) an epoxy resin represented by formula (I): ##STR1## wherein R.sub.1, R.sub.2, R.sub.3, and R.sub.4 each represents an alkyl group having from 1 to 4 carbon atoms, and (B) a reaction product obtained by preliminarily reacting a silane compound represented by formula (II): ##STR2## wherein X represents a monovalent organic group having at least one functional group selected from the group consisting of a glycidyl group, an amino group, and a mercapto group; Y represents an alkoxy group having from 1 to 4 carbon atoms; and n represents 0, 1 or 2, with a phenol aralkyl resin represented by formula (III) ##STR3## wherein m represents 0 or a positive integer. The epoxy resin composition has low moisture absorption and low stress to provide a semiconductor device excellent in thermal crack resistance and moisture resistance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.