Patent · US Expired

Method of manufacturing and testing integrated optical components

US5296072A · kind A · utility

12Cited by
13References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 5, 1992
Grant dateMar 22, 1994
Priority date
Expiry dateNov 5, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T156/108
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method of manufacturing and testing integrated optical composites in which fiber pigtails are aligned with and attached to the optical output ports of a plurality of integrated optical components on a wafer, prior to separation into individual components. The multiple pigtails are arranged at the ends opposite the wafer, to facilitate optical connections during active alignment and measurement testing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.